What we deliver

A system engineered to your defect classes.

Generic off-the-shelf AOI rarely survives contact with real production. We scope AOI systems against the defects that actually matter on your line — presence/absence, dimensional, surface, colour, print, or assembly — and engineer the optics, lighting, and algorithms around those classes.

  • Defect-class analysis against your current quality data
  • Lens, lighting, and camera specification
  • Rule-based and vision-learning inspection algorithms
  • Conveyor, reject, and PLC integration
  • Inspection data logging with traceability to batch or serial
Automated optical inspection / vision metrology workstation
Typical defect classes

What AOI can catch — reliably.

We work with customers to categorise and stratify defects before specifying a system. The classes below are illustrative; your line is assessed on its own terms.

ELX

Electronics

Solder bridges, missing components, polarity, lifted leads, placement accuracy.

DIM

Dimensional

Feature presence, hole position, edge condition, part envelope.

SRF

Surface & cosmetic

Scratches, dents, contamination, colour / shade deviation.

PRT

Print & label

Character recognition, barcode grade, print density, registration.

ASM

Assembly

Missing fasteners, mis-orientation, sub-assembly completeness.

PKG

Packaging

Seal integrity indicators, date-code verification, carton orientation.

Deployment

Scoped, installed, measured.

PHASE 01

Defect & yield study

We review your current quality data and line layout to confirm where AOI will produce measurable yield or cost impact.

PHASE 02

System specification

Cameras, lighting, optics, fixturing, and rejection strategy specified against the confirmed defect classes.

PHASE 03

Integration & sign-off

Install, programme, validate with Gage R&R where applicable, and hand over with documentation and training.

Start with a scoping call

Tell us the defect class, the line speed, and the current inspection method — we'll assess fit and propose a path.

Book an AOI scoping call